TY  - GEN
AU  - Sullivan, F
AU  - Kahaner, D
AU  - Fowler, H A
AU  - Knapp-Cordes, J
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1983-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.IR.83-2643
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1983
TI  - Wave form simulations for Josephson junction circuits used for noise thermometry:
ER  -