TY  - GEN
AU  - Kamper, R A
AU  - Kline, K E
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1982-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.IR.82-1677
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1982
TI  - Metrology for electromagnetic technology ::a bibliography of NBS publications
ER  -