TY  - GEN
AU  - Carver, G P
AU  - Mattis, R L
AU  - Buehler, M G
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1981-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.IR.81-2234
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1981
TI  - Microelectronic test patterns NBS-12 and NBS-24:
ER  -