TY  - GEN
AU  - Larson, Donald R
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1981-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.IR.81-1652
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1981
TI  - A measurement method for determining the optical and electro-optical properties of a thin film:
ER  -