TY  - GEN
AU  - Oettinger, F F
AU  - Larrabee, R D
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1980-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.IR.80-2061
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1980
TI  - Measurement techniques for high power semiconductor materials and devices ::annual report, October 1, 1978 to September 30, 1979
ER  -