TY  - GEN
AU  - Shier, D R
AU  - Neupauer, S J
AU  - Saunders, P B
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1979-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.IR.79-1920
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1979
TI  - A collection of test problems for discrete linear L? data fitting:
ER  -