TY  - GEN
AU  - Larrabee, R D
AU  - Thurber, W R
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1979-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.IR.79-1786R
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1979
TI  - Temperature dependence of the responsivity of indium-doped silicon infrared detectors:
ER  -