TY  - GEN
AU  - Carver, G P
AU  - Buehler, M G
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1979-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.IR.79-1744
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1979
TI  - The development of test structures for characterization of the fabrication and performance of radiation-hardened CCD images:
ER  -