TY  - GEN
AU  - Blackburn, D L
AU  - Koyama, R Y
AU  - Oattinger, F F
AU  - Rogers, G J
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1977-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.IR.77-1249
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1977
TI  - Measurement techniques for high power semiconductor materials and devices ::annual report, January 1 to December 31, 1976
ER  -