TY  - GEN
AU  - Pella, P A
AU  - Kuehner, E C
AU  - Cassatt, W A
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1976-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.IR.75-970
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1976
TI  - Development of thin calibration standards for x-ray fluorescence analysis:
ER  -