TY  - GEN
AU  - Wacker, Paul F
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1975-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.IR.75-809
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1975
TI  - Non-planar near-field measurements ::spherical scanning
ER  -