TY  - GEN
AU  - Humphreys, J C
AU  - Chappell, S E
AU  - McLaughlin, W L
AU  - Jarrett, R D
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1973-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.IR.73-413
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1973
TI  - Measurement of depth-dose distributions in carbon, aluminum, polyethylene, and polystyrene for 10-MEV incident electrons:
ER  -