TY  - GEN
AU  - Jesch, R L
AU  - Engen, G F
AU  - Weidman, M P
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1973-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.IR.73-350
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1973
TI  - Adapter evaluation by automated measurements:
ER  -