TY  - GEN
AU  - Thurber, W Robert
AU  - Lewis, David C
AU  - Bullis, W Murray
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1973-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.IR.73-128
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1973
TI  - Resistivity and carrier lifetime in gold-doped silicon:
ER  -