TY  - GEN
AU  - Bassham, L E
AU  - Rukhin, A L
AU  - Soto, J
AU  - Nechvatal, J R
AU  - Smid, M E
AU  - Barker, E B
AU  - Leigh, S D
AU  - Levenson, M
AU  - Vangel, M
AU  - Banks, D L
AU  - Heckert, N A
AU  - Dray, J F
AU  - Vo, S
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2010-01-01 05:01:00
DO  - https://doi.org/10.6028/NIST.SP.800-22r1a
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2010
TI  - A statistical test suite for random and pseudorandom number generators for cryptographic applications:
ER  -