TY  - GEN
AU  - Rukhin, Andrew
AU  - Sota, Juan
AU  - Nechvatal, James
AU  - Smid, Miles
AU  - Barker, Elaine
AU  - Leigh, Stefan
AU  - Levenson, Mark
AU  - Vangel, Mark
AU  - Banks, David
AU  - Heckert, Alan
AU  - Dray, James
AU  - Vo, San
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2000-01-01 05:01:00
DO  - https://doi.org/10.6028/NIST.SP.800-22
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2000
TI  - A statistical test suite for random and pseudorandom number generators for cryptographic applications:
ER  -