TY  - GEN
AU  - McCowan, C N
AU  - Splett, J D
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2008-01-01 05:01:00
DO  - https://doi.org/10.6028/NIST.SP.260-171
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2008
TI  - Charpy machine verification ::limits and uncertainty/
ER  -