TY  - GEN
AU  - Ehrstein, James R
AU  - Croarkin, M Carroll
AU  - Liu, Hung Kung
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2006-01-01 05:01:00
DO  - https://doi.org/10.6028/NIST.SP.260-131e2006
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2006
TI  - Standard Reference material ::the certification of 100 mm diameter silicon resistivity SRMs 2541 through 2547 using dual-configuration four-point probe maesurements, 2006 edition
ER  -