TY  - GEN
AU  - Drexler, Elizabeth S
AU  - Regnault, William F
AU  - Tesk, John A
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2006-01-01 05:01:00
DO  - https://doi.org/10.6028/NIST.SP.1047
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2006
TI  - Measurement methods for evaluation of the reliability of active implantable medical devices ::report of a workshop held October 3-4, 2005 Gaithersburg, Maryland
ER  -