TY  - GEN
AU  - Duewer, David L
AU  - Duewer, David L
AU  - Parris, Reenie M
AU  - White, Edward V
AU  - May, Willie E
AU  - Elbaum, Howard
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2004-01-01 05:01:00
DO  - https://doi.org/10.6028/NIST.SP.1012
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2004
TI  - An approach to the metrologically sound traceable assessment of the chemical purity of organic reference materials:
ER  -