TY  - GEN
AU  - Rasmussen, A L
AU  - Simpson, P A
AU  - Sanders, A A
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1989-01-01 05:01:00
DO  - https://doi.org/10.6028/NIST.IR.89-3917
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1989
TI  - Improved low-level silicon-avalanche-photodiode transfer standards at 1.064 micrometers:
ER  -