TY  - GEN
AU  - Leedy, T F
AU  - Lentner, K J
AU  - Laug, O B
AU  - Bell, B A
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1989-01-01 05:01:00
DO  - https://doi.org/10.6028/NIST.IR.88-4021
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1989
TI  - Electrical performance tests for hand-held digital multimeters:
ER  -