TY  - GEN
AU  - Choong, Yee-Yin
AU  - Theofanos, Mary
AU  - Stanton, Brian
AU  - Hofmann, Patrick
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2009-01-01 05:01:00
DO  - https://doi.org/10.6028/NIST.IR.7645
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2009
TI  - Symbols representing biometrics in use:
ER  -