TY  - GEN
AU  - Phillips, P J
AU  - Sahibzada, H A
AU  - Flynn, Patrick J
AU  - Bowyer, K W
AU  - O'Toole, A
AU  - Weimer, S
AU  - Beveridge, J R
AU  - Draper, B
AU  - Bolme, D
AU  - Givens, G H
AU  - Lui, Y M
AU  - Scallan, J A
AU  - Scruggs, W T
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2009-01-01 05:01:00
DO  - https://doi.org/10.6028/NIST.IR.7607
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2009
TI  - Overview of the multiple biometrics grand challenge:
ER  -