TY  - GEN
AU  - Tabassi, Elham
AU  - Grother, Patrick
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2007-01-01 05:01:00
DO  - https://doi.org/10.6028/NIST.IR.7422
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2007
TI  - Quality summarization ::recommendations on biometric quality summarization across the application domain
ER  -