TY  - GEN
AU  - Gayle, Frank W
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2003-01-01 05:01:00
DO  - https://doi.org/10.6028/NIST.IR.6971
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2003
TI  - Micro- & optoelectronics, annual report:
ER  -