TY  - GEN
AU  - Evans, John
AU  - Frechette, Simon
AU  - Horst, John
AU  - Huang, Hui
AU  - Kramer, Thomas
AU  - Messina, Elena
AU  - Proctor, Fred
AU  - Rippey, Bill
AU  - Scott, Harry
AU  - Vorburger, Ted
AU  - Wavering, Al
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2001-01-01 05:01:00
DO  - https://doi.org/10.6028/NIST.IR.6847
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2001
TI  - Analysis of dimensional metrology standards:
ER  -