TY  - GEN
AU  - Ridder, Stephen D
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2001-01-01 05:01:00
DO  - https://doi.org/10.6028/NIST.IR.6776
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2001
TI  - Thermal spray process reliability::sensors and diagnostics, summary of a workshop held at the National Institute of Standards and Technology
ER  -