TY  - GEN
AU  - Stieren, David C
AU  - Luce, Mark E
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2000-01-01 05:01:00
DO  - https://doi.org/10.6028/NIST.IR.6490
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2000
TI  - Information-based manufacturing program summary and accomplishments:
ER  -