TY  - GEN
AU  - Sebring, Lynn
AU  - Butcher, Tina G
AU  - Oppermann, Henry R
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2000-01-01 05:01:00
DO  - https://doi.org/10.6028/NIST.IR.6304e2000
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2000
TI  - NIST indices of NTEP device evaluations:
ER  -