TY  - GEN
AU  - Narahari, Y
AU  - Lyons, R SudarsanK W
AU  - Duffey, M R
AU  - Sriram, R D
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1998-01-01 05:01:00
DO  - https://doi.org/10.6028/NIST.IR.6223
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1998
TI  - Design for tolerance of electro-mechanical assemblies::an integrated approach
ER  -