TY  - GEN
AU  - McHenry, H I
AU  - Siewert, T A
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1996-01-01 05:01:00
DO  - https://doi.org/10.6028/NIST.IR.6064
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1996
TI  - Materials reliability, technical activities 1997:
ER  -