TY  - JOUR
AU  - Holtz, Megan
AU  - Herzing, Andrew
AU  - Gorman, Brian
C2  - Microscopy and Microanalysis
DA  - 2023-07-22 04:07:00
LA  - en
PB  - Microscopy and Microanalysis
PY  - 2023
TI  - Scanning Nanobeam Electron Diffraction for Atom Probe Tomography
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=936601
ER  -