TY  - JOUR
AU  - Mukim, Prashansa
AU  - Shrestha, Pragya
AU  - Madhavan, Advait
AU  - Prasad, Nitin
AU  - Campbell, Jason
AU  - Brewer, Forrest
AU  - Stiles, Mark
AU  - McClelland, Jabez J.
C2  - IEEE Electron Device Letters
DA  - 2023-07-12 04:07:00
DO  - https://doi.org/10.1109/LED.2023.3294722
LA  - en
M1  - 44
PB  - IEEE Electron Device Letters
PY  - 2023
TI  - Characterization of Noise in CMOS Ring Oscillators at Cryogenic Temperatures
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=936783
ER  -