TY  - VIDEO
AU  - Johnston-Peck, Aaron
AU  - Herzing, Andrew
C2  - Electronic Device Failure Analysis Magazine
DA  - 2023-08-01 04:08:00
LA  - en
PB  - Electronic Device Failure Analysis Magazine
PY  - 2023
TI  - Four-dimensional scanning transmission electron microscopy: I, Imaging, strain mapping and defect detection
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=936621
ER  -