TY  - CONF
AU  - Moxim, Stephen
AU  - Ashton, James
AU  - Anders, Mark
AU  - Lawson, Nathaniel
AU  - Ryan, Jason
C2  - Proceedings of the International Integrated Reliability Workshop, Fallen Leaf Lake, CA, US
DA  - 2024-03-27 04:03:00
DO  - https://doi.org/10.1109/IIRW59383.2023.10477645
LA  - en
PB  - Proceedings of the International Integrated Reliability Workshop, Fallen Leaf Lake, CA, US
PY  - 2024
TI  - Relationship between Trapping Centers, Charge Pumping, and Leakage Currents in Hot-Carrier-Stressed Si/SiO2/HfO2 Transistors
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=956850
ER  -