TY  - CONF
AU  - Cho, Seulki
AU  - Zaslavsky, Alexander
AU  - Richter, Curt A.
AU  - Majikes, Jacob
AU  - Liddle, James Alexander
AU  - Andrieu, François
AU  - Barraud, Sylvain
AU  - Balijepalli, Arvind
C2  - Proceedings of the IEEE Electron Device Meeting, San Francisco, CA, US
DA  - 2023-01-23 05:01:00
DO  - https://doi.org/10.1109/IEDM45625.2022.10019493
LA  - en
PB  - Proceedings of the IEEE Electron Device Meeting, San Francisco, CA, US
PY  - 2023
TI  - High-Resolution DNA Binding Kinetics Measurements with Double Gate FD-SOI Transistors
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=935166
ER  -