TY  - CONF
AU  - Okoro, Chukwudi
AU  - Levine, Lyle
AU  - Obeng, Yaw
AU  - Hummler, Klaus
AU  - Xu, Ruqing
C2  - Proceeding of IEEE Electronic Components and Technology Conference (ECTC), Lake Buena Vista, FL
DA  - 2014-05-26
LA  - en
PB  - Proceeding of IEEE Electronic Components and Technology Conference (ECTC), Lake Buena Vista, FL
PY  - 2014
TI  - X-Ray Micro-Beam Diffraction Measurement of the Effect of Thermal Cycling on Stress in Cu TSV: A Comparative Study
ER  -