TY  - CONF
AU  - Candell, Rick
AU  - Liu, Yongkang
AU  - Hany, Mohamed
AU  - Montgomery, Karl
AU  - Foufou, Sebti
C2  - IFIP 17th International Conference on Product Lifecycle, Rapperswil, CH
DA  - 2020-11-10 05:11:00
DO  - https://doi.org/10.1007/978-3-030-62807-9_15
LA  - en
PB  - IFIP 17th International Conference on Product Lifecycle, Rapperswil, CH
PY  - 2020
TI  - Smart Manufacturing Testbed for the Advancement of Wireless Adoption in the Factory
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=930124
ER  -