TY  - JOUR
AU  - Raunak, M S
AU  - Kuhn, D. Richard
AU  - Kacker, Raghu N.
AU  - Lei, Yu
C2  - IEEE Reliability Magazine
DA  - 2024-05-14 04:05:00
DO  - https://doi.org/10.1109/MRL.2024.3389629
LA  - en
M1  - 1
PB  - IEEE Reliability Magazine
PY  - 2024
TI  - Ensuring Reliability Through Combinatorial Coverage Measures
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=957862
ER  -