TY  - CONF
AU  - Hanssen, Leonard
AU  - Kaplan, Simon
AU  - Mekhontsev, Sergey
C2  - 8th Int''l Symp. Temperature and Thermal Measurements in Industry and Science , Berlin, GE
DA  - 2003-01-01
LA  - en
PB  - 8th Int''l Symp. Temperature and Thermal Measurements in Industry and Science , Berlin, GE
PY  - 2003
TI  - Fourier Transform System for Characterization of Infrared Spectral Emittance of Materials, ed. by B. Fellmuth, J. Seidel, and G. Scholz
ER  -