TY  - JOUR
AU  - Eppeldauer, George
AU  - Migdall, Alan
AU  - Cromer, C
C2  - Thermal Phenomena at Molecular and Microscales and in Cryogenic Infrared Detectors AIAA/ASME HTD
DA  - 1994-01-01
LA  - en
M1  - 277
PB  - Thermal Phenomena at Molecular and Microscales and in Cryogenic Infrared Detectors AIAA/ASME HTD
PY  - 1994
TI  - A Cryogenic Silicon Resistance Bolometer for use as an Infrared Transfer Standard Detector, ed. by M. Kaviany, D.A. Kaminski, A. Majuimda, P.E. Phelan, M.M. Youvanovich Pages: and Z.M. Zhang
ER  -