TY  - CONF
AU  - Bruce, S
AU  - Cromer, C
C2  - NCSL International Conference , San Diego, CA
DA  - 2002-01-01
LA  - en
PB  - NCSL International Conference , San Diego, CA
PY  - 2002
TI  - NIST Measurement Services That Support Optoelectronics
ER  -