TY - CONF AU - Secula, Erik AU - Liddle, James C2 - Frontiers of Characterization and Metrology for Nanoelectronics: 2024, Monterey, CA, US DA - 2024-12-05 13:12:59 LA - en PB - Frontiers of Characterization and Metrology for Nanoelectronics: 2024, Monterey, CA, US PY - 2024 TI - Frontiers of Characterization and Metrology for Nanoelectronics: 2024 ER -