TY  - GEN
AU  - Lu, Yan
AU  - Kulvatunyou, Boonserm
AU  - Wilson, James Jim
AU  - Figura, Michael
AU  - Ki, Josh
AU  - Noller, David
C2  - Advanced Manufacturing Series (NIST AMS), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2025-01-06 05:01:00
DO  - https://doi.org/10.6028/NIST.AMS.100-65
LA  - en
PB  - Advanced Manufacturing Series (NIST AMS), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2025
TI  - Metadata Modeling for Manufacturing Enterprise Integration
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=959073
ER  -