TY  - GEN
AU  - Rekhi, Sanjay
AU  - Kuhn, David
AU  - Schaffer, Kim
AU  - Souppaya, Murugiah
AU  - Waller, Noah
AU  - Hastings, Nelson
AU  - Ogata, Michael
AU  - Barker, William
C2  - NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2025-02-18 05:02:00
DO  - https://doi.org/10.6028/NIST.IR.8532
LA  - en
PB  - NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2025
TI  - Workshop on Enhancing Security of Devices and Components Across the Supply Chain
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=959182
ER  -