TY  - JOUR
AU  - Archenti, Andreas
AU  - Gao, Wei
AU  - Donmez, Alkan
AU  - Savio, Enrico
AU  - Irino, Naruhiro
C2  - CIRP Annals-Manufacturing Technology
DA  - 2024-06-01 04:06:00
DO  - https://doi.org/10.1016/j.cirp.2024.05.003
LA  - en
M1  - 73
PB  - CIRP Annals-Manufacturing Technology
PY  - 2024
TI  - Integrated metrology for advanced manufacturing
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=957746
ER  -