TY  - CONF
AU  - Kuo, Yu-Hsin
AU  - Matthews, Dylan
AU  - Muramoto, Shinichiro
AU  - Song, TaeYoung
AU  - Zhang, Chengyang
AU  - Zhao, Xianduo
AU  - Rahman, Md
AU  - Kang, Sanghyun
AU  - Aguirre, Andres
AU  - Lee, Seung
AU  - Ha, Daewon
AU  - Dutta, Sourav
AU  - Moise, Theodore
AU  - Ravichandran, Jayakanth
AU  - Yu, Shimeng
AU  - Grutter, Alexander
AU  - Datta, Suman
AU  - Roy, Tania
AU  - Khan, Asif
C2  - 2025 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), Kyoto, JP
DA  - 2025-03-18 00:03:00
LA  - en
PB  - 2025 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), Kyoto, JP
PY  - 2025
TI  - On the Impact of Hydrogen Infiltration into Amorphous Oxide Transistor Performance during Forming Gas Annealing (FGA) and its Mitigation
ER  -