TY  - GEN
AU  - Deisenroth, David
AU  - Weaver, Jordan
AU  - Mekhontsev, Sergey
AU  - Grantham, Steven
AU  - Moylan, Shawn P.
C2  - Advanced Manufacturing Series (NIST AMS), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2025-04-01 04:04:00
DO  - https://doi.org/10.6028/NIST.AMS.100-67
LA  - en
PB  - Advanced Manufacturing Series (NIST AMS), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2025
TI  - Laser Beam Metrology for AM-Bench 2022: Approaches, Results, and Lessons Learned
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=958616
ER  -