TY  - JOUR
AU  - Gupta, R
AU  - Lykke, Keith
AU  - Shaw, Ping-Shine
AU  - Dehmer, J
C2  - SPIE
DA  - 1999-01-01
LA  - en
M1  - 3818
PB  - SPIE
PY  - 1999
TI  - Characterization of UV-Induced Radiation Damage in Si-based Photodiodes
ER  -